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Materials Characterization & Investigation

The Technical Administration Office (TAO) is well equipped with the most recent instruments for conducting materials characterization and investigation using Chemical , Physical and Mechanical investigations. Many of these tests have ISO 17025.
The following are some of these available instruments.
• XRD
• XRD with Heating Stage
• XRD Thin Film
• XRF
• SEM
• HR-TEM
• Surface Area Analyzer
• TG – DTA – DSC
• ICP
• FTIR
• Micro-RAMAN
• Vibrating Sample Magnetometer; VSM
• Impact Testing Machine
• Plane Bending Machine
• Optical Emission Spectrometer
• Potentiostat-Galvanostat/FRA
• Spin Coating
• High vacuum chamber system
• Dynamic light scattering particle size analyzer